Sonoscan’s Dr. Kessler Receives OECE Award
Elk Grove Village, IL — February 14, 2007
Dr. Lawrence W. Kessler, Founder, CEO and President of Sonoscan, Inc., has received the Outstanding Electrical and Computer Engineer (OECE) award from Purdue University.
First given in 1992, the award recognizes Purdue alumni “who have demonstrated exemplary accomplishments, leadership and service to community.”
Dr. Kessler was selected because of his development, since the early 1970s, of imaging technologies using very high frequency ultrasound. Additionally, he was recognized for his vision in successfully developing technologies for which a demand had not been demonstrated.
Sonoscan’s first instrument, in 1974, was the transmission-mode SLAM™. In 2006, Sonoscan began shipping the fifth generation of the reflection-mode C-SAM®, the successor to SLAM.
Over Sonoscan’s 34-year history, Dr. Kessler has also made it the only company of its type that has applications laboratories where customers can have components imaged and analyzed. It was largely through Sonoscan’s applications laboratories that acoustic microscopy became widely known and accepted. Currently Sonoscan has seven application laboratories on three continents.
Dr. Kessler takes pride in the global acceptance of acoustic microscopy, and notes that acoustic techniques that formerly could be performed only by specialists in research labs are now carried out every day as routine procedures in production and assembly environments.
Dr. Kessler received his B.S. in electrical engineering from Purdue University, and his Ph.D. in electrical engineering from the University of Illinois. He has authored more than 150 technical papers, holds 11 patents and is past president of the IEEE Ultrasonics and Ferroelectrics Society.
Sonoscan, Inc. 2149 E. Pratt Blvd., Elk Grove Village, IL 60007. Phone 847-437-6400. Contact Bill Zuckerman x237. Email firstname.lastname@example.org; web www.sonoscan.com.
About Sonoscan®: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.
Through its SonoLab division Sonoscan applications engineers, with experience totaling more than two centuries in acoustic microscopy, assist hundreds of customers annually in solving materials problems and quality control issues. SonoLab operates applications testing laboratories in multiple global locations to serve the inspection needs of customers that do not have their own capability.