Discover Defects First

Sonoscan is the most experienced source in Acoustic Microscopy for non-destructive internal inspection and analysis.

Detection technology for your application

Microelectronics

Automotive

Military & Aerospace

MEMS, Wafers & Seals

Materials & Composites

Products and Services

Laboratory instruments

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Testing services

Learn from Sonoscan

Our current highlights

Sonoscan’s Silicon Valley C-SAM® Upcoming User Training Workshop: February 2, 2017; Sonoscan’s SonoLab in Santa Clara, CA will be hosting a two and half day Advanced and Intermediate User Training Workshop ... More
Large-Area C-SAM® Tool for the Production Floor: February 1, 2017; Sonoscan® has introduced the J610™, the latest member of its C-SAM® acoustic microscope line. The J610 is a semi-automated tool ... More
Surface Tracker "Flattens" Wafers: May 3, 2016; Silicon wafers are supposed to be "flat" when they are being scanned by an acoustic micro imaging tool for defect ... More