Press Releases / News

Pictured

ME—Ceramic Chip Capacitor
Internal defects such as delaminations, cracks and voids within ceramic chip capacitors can lead to product failure.

Press Releases / News

Sonoscan’s Silicon Valley C-SAM® Upcoming User Training Workshop
February 2, 2017
Sonoscan’s SonoLab in Santa Clara, CA will be hosting a two and half day Advanced and Intermediate User Training Workshop ... More
Large-Area C-SAM® Tool for the Production Floor
February 1, 2017
Sonoscan® has introduced the J610™, the latest member of its C-SAM® acoustic microscope line.  The J610 is a semi-automated tool ... More
Surface Tracker "Flattens" Wafers
May 3, 2016
Silicon wafers are supposed to be "flat" when they are being scanned by an acoustic micro imaging tool for defect ... More
Globally Matched SonoTools Streamline Component Inspection
February 3, 2016
Automated acoustic micro imaging tools in different manufacturing plants can often produce different images of defects in identical components. Resolving ... More
Sonoscan's Steve Martell Wins IPC President's Award
March 31, 2015
Steve Martell, Manager for Advanced Applications Support at Sonoscan, received the IPC President's Award during the IPC APEC EXPO® at ... More
Sonoscan Automates Inspection of IGBT Modules
January 15, 2015
Power IGBT modules having voids and other internal structural defects are a problem for makers and users of the modules. ... More
Deputy Chief Minister Datuk Mohd Rashid Hasnon Visits Nepcon Penang
July 9, 2014
Natalie Yeo, Applications Engineer, demonstrates Sonoscan's C-SAM Gen6 acoustic microscope to Deputy Chief Minister Datuk Mohd Rashid Hasnon of Penang, ... More
MEMS Wafer Inspection System
June 25, 2014
Sonoscan has announced its AW322 200™ fully automated system for ultrasonic inspection of MEMS wafers. Based on Sonoscan’s C-SAM® technology, ... More
ISO/IEC 17025:2005 Certification for SonoLab Locations
May 29, 2014
Sonoscan’s decades-old quality management system has reached a new level with its recent ISO/IEC 17025:2005 certification from the American Association ... More
Faster, Flexible, Automated Acoustic Scanning of Components
January 14, 2014
Sonoscan® has begun shipping its new Model DF2400™ in its FACTS2™ line of C-SAM® acoustic microscopes. Key features are: 2x to 7x ... More
Power Modules Get Their Own Upside-Down C-SAM® System
December 2, 2013
Sonoscan has shipped the first of its new D9600Z C-SAM® systems. This new model is designed expressly to facilitate the ... More
Digital Image Analysis Toolbox from Sonoscan
July 8, 2013
Sonoscan announces its enhanced Digital Image Analysis Toolbox™ used for automated acoustic analysis of individual IC components, various types of ... More
Acoustic Imaging of 3D IC and Die Stacks Made Easier with Sonoscan® Simulation Software
July 12, 2012
3D IC and Stacked die configurations are often difficult to image with an acoustic microscope because the multiple internal surfaces ... More
Sonoscan’s New Lab Model C-SAM® Acoustic Microscope
July 10, 2012
Sonoscan® has unveiled its newest Lab Model D9600™ C-SAM® acoustic micro imaging system, specifically designed to serve as a general-purpose ... More
Good Reviews for Sonoscan's Gen6™ Acoustic Microscope
April 12, 2012
Last July, when Sonoscan introduced its Gen6 high-end laboratory acoustic microscope, the designers of the microscope were eager to see ... More
Sonoscan's New High-End Lab Acoustic Microscope System
July 11, 2011
Today at the Semicon West show in San Francisco, Sonoscan announced the availability of the Gen6™ C-SAM® acoustic micro imaging ... More
Sonoscan Shipping 2x Throughput 300 mm Wafer Scanner
April 12, 2011
Sonoscan has begun shipping its automated 300 mm bonded wafer inspection system that simultaneously scans two wafers and gives users ... More
Viewing Nondestructively in 60-Micron Slices 
April 12, 2011
Sonoscan, Inc., the maker of acoustic micro imaging systems, has demonstrated the single-scan imaging of a sample at 50 different ... More
High-Speed Acoustic Microscope Well Received
July 16, 2010
The introduction at Semicon of Sonoscan’s high-throughput FastLine™ C-SAM acoustic microscope has brought praise from potential users of the system, ... More
Accelerated Manual Inspection System From Sonoscan
July 7, 2010
At the upcoming Semicon West Show (July 13-15), Sonoscan will introduce its new FastLine™ Acoustic Microscope. Specifically designed for accelerated ... More
MEMS Cavity Seal Integrity
May 12, 2010
As part of its bonded wafer inspection  technology, Sonoscan has recently demonstrated acoustic imaging of defects in the seal that ... More
Mil/Aero Reliability Inspection for Latent Defects
March 2, 2010
Sonoscan has publicly announced Sonoscan Critical Evaluation™ (SCE), a confidential service that acoustically inspects critical electronic components such as hybrids, ... More
Sonoscan Expands Counterfeit Identification Menu
January 26, 2010
SonoLab®, the applications laboratory division of Sonoscan, has recently developed analytical techniques that bring to 25 the number of acoustically ... More
IEEE Rayleigh Award to Sonoscan's Dr. Kessler
October 13, 2009
On September 21 in Rome, Italy, Sonoscan president Dr. Lawrence W. Kessler received the prestigious Rayleigh Award presented by the ... More
Effective Acoustic Microscope Imaging of Stacked Die
July 21, 2009
Sonoscan Inc., has announced that its SonoLab® division is offering a new service that provides greatly enhanced acoustic microscope imaging ... More
Sonoscan to Demonstrate “Operator Free” 300mm Wafer Handler at Semicon West 
May 14, 2009
Sonoscan, Inc., will demonstrate the functionality of its new AW300™ series robotic bonded wafer handler at Semicon West in San ... More
Sonoscan Office/Laboratory Moves To Fudan University
March 15, 2009
By invitation, Sonoscan has relocated its Shanghai headquarters office and its applications laboratory to a new facility associated with Fudan ... More
Sonoscan Announces Acoustic Microscopy Webinar Series
March 12, 2009
Sonoscan, the industry leader in Acoustic Micro Imaging, today announced a new webinar series. Topics will range from the basics ... More
Sonoscan Announces Asian Regional Service Manager 
October 14, 2008
Sonoscan, Inc., the designer and manufacturer of advanced acoustic microscopy systems, has announced the promotion of TsungHan (Lomen) Lee to ... More
Sonoscan Announces Advanced Thickness Measurement Method
September 30, 2008
In a joint effort with a large component supplier to the cellular and video industries, Sonoscan has developed an acoustic ... More
Sonoscan Launches HiRes Generation THRU-Scan™
July 1, 2008
Sonoscan, Inc., has introduced the HiRes Generation THRU-Scan™, which significantly enhances through-transmission imaging with Sonoscan’s C-SAM® line of acoustic microscopes. ... More
Sonoscan Introduces Acoustic Profiling Module
March 24, 2008
Sonoscan has introduced a new capability for its line of C - SAM acoustic microscopes that reveals the external surface ... More
Automated Bonded Wafer Inspection Tool From Sonoscan
December 7, 2007
Sonoscan has introduced the AW200™ Series C-SAM® acoustic micro imaging system, which performs automated inspection, analysis and sorting of bonded ... More
Sonoscan Lab Aids In Investigation For Dan Rather Reports
November 12, 2007
Sonoscan’s Silicon Valley applications laboratory (SSV) in Santa Clara, CA was selected recently to appear in an episode of HDNet’s ... More
Sonoscan Updates Its "Gold Standard" C-SAM® System
July 5, 2007
Sonoscan today unveiled the new D-9500™ update of its popular C-SAM® acoustic microscope system.  The contemporary D-9500 replaces the widely ... More
Sonoscan Shows Delamination Breakthrough
May 16, 2007
Sonoscan has demonstrated that some delaminations in plastic IC packages contain not only air but also a fluid contaminant, and ... More
Sonoscan Names Sales Manager For China, Hong Kong
April 13, 2007
Sonoscan, Inc., the designer and manufacturer of advanced acoustic microscopy systems, has announced the appointment of Ginny Ho as Regional ... More
Sonoscan Expands Transducer Fab & Optimization
March 27, 2007
Sonoscan, Inc., the designer, developer and manufacturer of acoustic microscopes, has recently expanded its transducer operation, where new ultra-high frequency ... More
Sonoscan’s Dr. Kessler Receives OECE Award
February 14, 2007
Dr. Lawrence W. Kessler, Founder, CEO and President of Sonoscan, Inc., has received the Outstanding Electrical and Computer Engineer (OECE) ... More
Sonoscan Ships New Gen5™ C-SAM® Model
January 15, 2007
Sonoscan today announced that the first shipments of the Gen5™ Scanning Acoustic Microscope were made during their most recent fiscal quarter. This ... More
Sonoscan Expands FACTS2™ Production
December 1, 2006
Sonoscan has expanded and upgraded the assembly line that makes the FACTS2automated acoustic microscope systems, which is widely used to ... More
Sonoscan Launches UPH-Turbo™ For High-Speed Scanning
September 15, 2006
Sonoscan, Inc., the designer and manufacturer of acoustic microscope systems, has introduced UPH-Turbo™, a new method of acoustic scanning that ... More
Sonoscan Receives Patent For Frequency Domain Imaging
July 1, 2006
Sonoscan, Inc., the developer and manufacturer of acoustic microscope systems, has been issued U.S. Patent #6,890,302 that gives engineers a ... More
Sonoscan Granted Patent On Virtual Rescanning Acoustic Microscope
April 12, 2006
Sonoscan, Inc., the designer and maker of acoustic microscope systems, has been granted US Patent #6,895,820 covering the firm’s Virtual ... More
Sonoscan Sees Automation Driving Demand For Mass Component Screening
March 28, 2005
The need for highly automated electronic production, along with higher expectations for product reliability, are driving the demand for automated ... More