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Pictured

ME—Ceramic Chip Capacitor
Internal defects such as delaminations, cracks and voids within ceramic chip capacitors can lead to product failure.

Acoustic Imaging of 3D IC and Die Stacks Made Easier with Sonoscan® Simulation Software

Elk Grove Village, IL — July 12, 2012

3D IC and Stacked die configurations are often difficult to image with an acoustic microscope because the multiple internal surfaces send back so many echoes and re-echoes from the ultrasound pulsed into the stack. Stacked die makers wanting to check nondestructively for delaminations between layers have often been frustrated by this limitation.

Sonoscan (www.sonoscan.com) has now taken a major step toward resolving this problem with the introduction of its SonoSimulator™ software, which is now a standard feature on the Gen6™ C-SAM® acoustic microscope.

The SonoSimulator determines optimal gate positions and other parameters with far less effort than is possible with the physical stacked parts alone. It also results in higher quality acoustic images.

This powerful new software allows the operator to create a virtual die stack that matches the characteristics of the physical 3D IC or die stack to be inspected, including defects at specified layers.

The virtual defects help determine the optimum placement of gates to image specific levels in the stack. The imaging parameters are then easily transferred to the Gen6 Sonolytics™ software and used to image the physical 3D IC or die stack.

In a short time the best gate positions and other parameters for imaging the physical 3D IC or die stack can be obtained, even by less experienced operators.


Sonoscan, Inc. 2149 E. Pratt Blvd., Elk Grove Village, IL 60007. Phone 847-437-6400. Contact Bill Zuckerman x237. Email bzuckerman@sonoscan.com; web www.sonoscan.com.

About Sonoscan®: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.

Through its SonoLab division Sonoscan applications engineers, with experience totaling more than two centuries in acoustic microscopy, assist hundreds of customers annually in solving materials problems and quality control issues. SonoLab operates applications testing laboratories in multiple global locations to serve the inspection needs of customers that do not have their own capability.