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Pictured

ME—Ceramic Chip Capacitor
Internal defects such as delaminations, cracks and voids within ceramic chip capacitors can lead to product failure.

Sonoscan Shows Delamination Breakthrough

Elk Grove Village, IL — May 16, 2007

Sonoscan has demonstrated that some delaminations in plastic IC packages contain not only air but also a fluid contaminant, and that such 2-part delaminations can be imaged and characterized by C-SAM® acoustic microscope systems.

The phenomenon – seen, but never before identified by acoustic micro imaging - was thoroughly investigated when plastic IC samples were submitted to one of Sonoscan’s SonoLab™ application laboratories for nondestructive imaging.

In the acoustic images, the delaminations appeared partly red and partly white.   Subsequent physical disassembling of the IC packages and chemical analysis of the surfaces of both the die and the molding compound showed that areas of the delamination contained air and/or an organic fluid, probably a silicone.  The source of the silicone may be the mold machine, where silicone is sometimes used as a release agent.

The acoustic images used a unique Sonoscan “color map” preferred for detection of delaminations.  This color map in turn takes advantage of the fact that only Sonoscan C-SAM systems have the unique ability to discriminate between small differences in the polarity of acoustic signals.  Without this feature, such two-part delaminations cannot be distinguished from delaminations that contain only air.

For more information, contact SonoLab Director Ray Thomas, (001) 847 437-6400 x 245. rthomas@sonoscan.com. 

Contamination gives this delamination two colors in the C-SAM acoustic image: red = air, white = fluid contaminant.

Sonoscan, Inc. 2149 E. Pratt Blvd., Elk Grove Village, IL 60007. Phone 847-437-6400. Contact Bill Zuckerman x237. Email bzuckerman@sonoscan.com; web www.sonoscan.com.

About Sonoscan®: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.

Through its SonoLab division Sonoscan applications engineers, with experience totaling more than two centuries in acoustic microscopy, assist hundreds of customers annually in solving materials problems and quality control issues. SonoLab operates applications testing laboratories in multiple global locations to serve the inspection needs of customers that do not have their own capability.