Press Releases / News

Pictured

ME—Ceramic Chip Capacitor
Internal defects such as delaminations, cracks and voids within ceramic chip capacitors can lead to product failure.

Effective Acoustic Microscope Imaging of Stacked Die

Elk Grove Village, IL — July 21, 2009

Sonoscan Inc., has announced that its SonoLab® division is offering a new service that provides greatly enhanced acoustic microscope imaging of stacked die assemblies.

The new service, available immediately, uses Sonoscan's proprietary software developed over the last two (2) years. The new software images die stacks with unprecedented accuracy for internal defect analysis.

Most significantly, it can assign a defect or other feature to a specific layer within the stack, a capability that had been limited due to the thinness and number of layers, until now!

"The merging of the new software with Sonoscan's C-SAM® hardware means that we can now effectively and consistently image the multiple layers in stacked die configurations," said SonoLab® Manager Ray Thomas. "In the hands of our experienced applications engineers, this software provides accurate and reliable analyses of stacked die."

"IC designers, IC packaging engineers, semiconductor failure analysis labs, and semiconductor manufacturing engineers are among those who will benefit from this new analytical service," he added.

More information is available from SonoLab® Manager Ray Thomas. 
Phone 847.437.6400, x245 
Email: rthomas@sonoscan.com.

For additional information, contact Steve Martell, Manager of Technical Support Services. 

Demonstration of Stacked Die Imaging at Sonoscan

Download the PDF announcement


Sonoscan, Inc. 2149 E. Pratt Blvd., Elk Grove Village, IL 60007. Phone 847-437-6400. Contact Bill Zuckerman x237. Email bzuckerman@sonoscan.com; web www.sonoscan.com.

About Sonoscan®: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.

Through its SonoLab division Sonoscan applications engineers, with experience totaling more than two centuries in acoustic microscopy, assist hundreds of customers annually in solving materials problems and quality control issues. SonoLab operates applications testing laboratories in multiple global locations to serve the inspection needs of customers that do not have their own capability.