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ME—Ceramic Chip Capacitor
Internal defects such as delaminations, cracks and voids within ceramic chip capacitors can lead to product failure.

Sonoscan's Steve Martell Wins IPC President's Award

Elk Grove Village, IL — March 31, 2015

Steve Martell, Manager for Advanced Applications Support at Sonoscan, received the IPC President's Award during the IPC APEC EXPO® at the San Diego Convention Center on March 3.

Soon to celebrate his thirtieth year at Sonoscan, Martell was honored for his service to the electronics industry and to the IPC. His years among Sonoscan’s innovative engineers, alongside the world’s largest acoustic testing laboratory for components (SonoLab®), let him make unique contributions to component and assembly standards, technology and education.

Over the years he has brought Sonoscan’s technological expertise to a number of IPC committees, and currently is a member of nine IPC committees that focus on the standards and applications for acoustic micro imaging of MEMS devices, silicon wafers, 3D ICs, HB-LED devices, plastic chip carrier cracking, counterfeit components and other areas. He is the chairman of two of these committees.

Because he deals with applications where Sonoscan’s C-SAM® technology solves problems, Martell’s work covers the entire spectrum from the Front End environment (wafers, ingots) to Mid End (3D ICs) to Back End (electronic components) to populated printed circuit boards.

In addition to serving as the liaison with organizations concerned with standards within the electronics industry, Martell is also responsible for Sonoscan’s applications support and especially for automated in-line Acoustic Micro Imaging Systems used in manufacturing.

Download the PDF announcement


Sonoscan, Inc. 2149 E. Pratt Blvd., Elk Grove Village, IL 60007. Phone 847-437-6400. Contact Bill Zuckerman x237. Email bzuckerman@sonoscan.com; web www.sonoscan.com.

About Sonoscan®: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.

Through its SonoLab division Sonoscan applications engineers, with experience totaling more than two centuries in acoustic microscopy, assist hundreds of customers annually in solving materials problems and quality control issues. SonoLab operates applications testing laboratories in multiple global locations to serve the inspection needs of customers that do not have their own capability.