Quantitative B-Scan Analysis Mode (Q-BAM)™

Pictured

Flip Chip
300 MHz image showing void (red) in underfill.

Quantitative B-Scan Analysis Mode (Q-BAM)™

Quantitative B-Scan Analysis Mode (Q-BAM)™ is a calibrated, non-destructive cross-section image in the X-Z plane of a sample, which is completely in focus through the entire Z depth and contains amplitude/polarity data. Q-BAM is considered to be a “Virtual Cross-section” of the sample.